ÄPRE’s Fizeau & LUPI interferometers, with patented light sources, provides you with an interferometer system to expand your capabilities. No other interferometer has nearly the range of applications possible from measuring ultra-thin 0.075 mm substrates without surface preparation, to radius, form, Mid Spatial Frequency and Fourier analyses. APRE’s exceptional performance is based on a direct imaging, diffraction limited optical design, with image resolutions up to 24 lines/mm, <0.06% image distortion and <λ/20 retrace errors at slopes up to 512 fringes/aperture. Select from three interchangeable sources including SpectrÄ SCI, proprietary wavelength shifting ÄTLas, or stabilized HeNe lasers to configure your system. Custom and non-standard wavelength options are readily available.